Recent applications of hard x-ray photoelectron spectroscopy

X - Ray Photoelectron Spectroscopy of Silicate Glasses

X-ray photoelectron spectroscopy (XPS) is a powerful technique capable of providing unique information about the structural chemistry of glasses. However, inappropriate procedures for the preparation of sample surfaces or the lack of reliable methods to overcome electrostatic charging effects during analysis of dielectric materials can cause spurious features to be introduced or intrinsic featu...

Compositional depth profile analysis of coatings on hard disks by X-ray photoelectron spectroscopy and imaging

A hard disk medium is typically composed of several layers including the magnetic recording layer, a buffer layer, as well as a wear protective layer. In the work presented here, the hard disks analysed have a total of five layers with the uppermost layer being the lubricant. The second layer is diamond like coating and this is followed by the magnetic layer consisting of an alloy of cobalt and...

Electronic structure of delta-doped La:SrTiO3 layers by hard x-ray photoelectron spectroscopy

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Reactive ZnO/Ti/ZnO interfaces studied by hard x-ray photoelectron spectroscopy

Hard-X-ray Zone Plates: Recent Progress

The technology to focus hard-X-rays (photon energy larger than 1–2 keV) has made great progress in the past three years. The progress was particularly spectacular for lenses based on the Fresnel zone plate concept. The spatial resolution notably increased by a factor of three, opening up entirely new domains of application, specifically in biomedical research. As we shall see, this evolution is...